Описание: Test and diagnosis of analogue, mixed-signal and RF integrated circuits :

Електронна книга

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Автор-организации:	Institution of Engineering and Technology.
Други автори:	Sun, Yichuang. (Editor)
Формат:	Електронна книга
Език:	English
Публикувано:	London : Institution of Engineering and Technology, 2008.
Серия:	IET circuits, devices and systems series ; 19.
Предмети:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing. Linear integrated circuits. Radio circuits. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General. Electronic books.
Онлайн достъп:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=292173
Подобни документи:	Print version:: Test and diagnosis of analogue, mixed-signal and RF integrated circuits.

Резюме:	Annotation
Описание на библ. документ:	Title from title screen.
Физически характеристики:	1 online resource (xx, 389 pages) : illustrations.
Библиография:	Includes bibliographical references and index.
ISBN:	9780863419997 0863419992 9781615833153 1615833153