ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California /
| Автор-организация: | International Symposium for Testing and Failure Analysis San Jose, Calif.), Electronic Device Failure Analysis Society., International Symposium for Testing and Failure Analysis/2011., ASM International. |
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| Формат: | Електронен |
| Език: | English |
| Публикувано: |
Materials Park, OH :
ASM International,
2011.
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| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=438625 |
| Подобни документи: |
Print version::
ISTFA 2011. |
| Описание на библ. документ: |
Some online versions lack accompanying media packaged with the printed version. |
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| Физически характеристики: |
1 online resource (xix, 456 pages) : illustrations |
| Библиография: |
Includes bibliographical references and index. |
| ISBN: |
9781615038503 1615038507 9781680155112 1680155113 |