Корично изображение Електронна книга

VLSI test principles and architectures : design for testability /

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

Пълно описание

Други автори: Wang, Laung-Terng, (Editor), Wu, Cheng-Wen, EE Ph. D., (Editor), Wen, Xiaoqing, (Editor)
Формат: Електронна книга
Език: English
Публикувано: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, ℗♭2006.
Серия: Morgan Kaufmann series in systems on silicon.
Предмети:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Circuits integres a€ tre€s grande echelle > Essais.
Circuits integres a€ tre€s grande echelle > Conception et construction.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic.
COMPUTERS > Logic Design.
Circuitos integrados vlsi.
Testen.
VLSI.
Electronic books.
Онлайн достъп: http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=189477
Подобни документи: Print version:: VLSI test principles and architectures.
Онлайн достъп от Библиотека ”Паница” на Американския университет в България:

http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=189477
Провери в Paniza Library, AUBG Сигнатура: TK7874.75 .V587 2006eb

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