Местоположение: Test and diagnosis of analogue, mixed-signal and RF integrated circuits :

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Електронна книга

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Автор-организации:	Institution of Engineering and Technology.
Други автори:	Sun, Yichuang. (Editor)
Формат:	Електронна книга
Език:	English
Публикувано:	London : Institution of Engineering and Technology, 2008.
Серия:	IET circuits, devices and systems series ; 19.
Предмети:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing. Linear integrated circuits. Radio circuits. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General. Electronic books.
Онлайн достъп:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=292173
Подобни документи:	Print version:: Test and diagnosis of analogue, mixed-signal and RF integrated circuits.

Онлайн достъп от Библиотека ”Паница” на Американския университет в България:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=292173

Провери в Paniza Library, AUBG	Сигнатура:	TK7874.654 .T47 2008eb