Gettering and defect engineering in semiconductor technology XIII GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dolnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009 /
This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, subm...
| Автор-организации: | International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" Dolnsee-Schorfheide, Germany) |
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| Други автори: | Kittler, Martin., Richter, H., 1940- |
| Формат: | Електронен |
| Език: | English |
| Публикувано: |
Stafa-Zuerich, Switzerland :
Trans Tech Publications,
℗♭2010.
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| Серия: |
Diffusion and defect data. Solid state phenomena ;
v. 156/158. |
| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=503559 |
| Подобни документи: |
Print version::
Gettering and defect engineering in semiconductor technology XIII. |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=503559 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QD543 .S64x v. 156/158eb |
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