X-ray absorption fine structure for catalysts and surfaces
X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be appl...
| Други автори: | Iwasawa, Yasuhiro, 1946- |
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| Формат: | Електронен |
| Език: | English |
| Публикувано: |
Singapore ; River Edge, N.J. :
World Scientific,
℗♭1996.
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| Серия: |
World Scientific series on synchrotron radiation techniques and applications ;
vol. 2. |
| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=564421 |
| Подобни документи: |
Print version::
X-ray absorption fine structure for catalysts and surfaces. |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=564421 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QD96.X2 X193 1996eb |
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