X-ray scattering from semiconductors /
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
| Основен автор: | Fewster, Paul F. |
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| Формат: | Електронна книга |
| Език: | English |
| Публикувано: |
London :
Imperial College Press,
℗♭2003.
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| Издание: | 2nd ed. |
| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=105165 |
| Подобни документи: |
Print version::
X-ray scattering from semiconductors. |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=105165 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QC482.S3 F49 2003eb |
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