X-ray scattering from semiconductors
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have bee...
| Основен автор: | Fewster, Paul F. |
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| Формат: | Електронен |
| Език: | English |
| Публикувано: |
London :
Imperial College Press,
2000.
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| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=521314 |
| Подобни документи: |
Print version::
X-ray scattering from semiconductors. |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=521314 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QC611.6.R3 F49 2000eb |
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