X-ray scattering from semiconductors
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have bee...
Основен автор: | Fewster, Paul F. |
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Формат: | Електронен |
Език: | English |
Публикувано: |
London :
Imperial College Press,
2000.
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Предмети: | |
Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=521314 |
Подобни документи: |
Print version::
X-ray scattering from semiconductors. |
Съдържание:
- Ch. 1. An introduction to semiconductor materials
- ch. 2. An introduction to X-ray scattering
- ch. 3. Equipment for measuring diffraction patterns
- ch. 4. A practical guide to the evaluation of structural parameters.