Characterization of high Tc materials and devices by electron microscopy /
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...
| Други автори: | Browning, Nigel D., Pennycook, Stephen J. |
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| Формат: | Електронна книга |
| Език: | English |
| Публикувано: |
Cambridge ; New York :
Cambridge University Press,
2000.
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| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=112386 |
| Подобни документи: |
Print version::
Characterization of high Tc materials and devices by electron microscopy. |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=112386 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QC611.98.H54 C43 2000eb |
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