Characterization in compound semiconductor processing /
This volume has been written to aid scientists and engineers working with compound semiconductor materials and devices in the selection and application of various analytical techniques. It highlights analytical problems that occur at all stages of materials or device processing (substrate preparatio...
| Други автори: | Strausser, Yale., McGuire, G. E. |
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| Формат: | Електронна книга |
| Език: | English |
| Публикувано: |
New York :
Momentum Press,
1995.
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| Серия: |
Materials characterization series.
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| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=501136 |
| Онлайн достъп от Библиотека ”Паница” на Американския университет в България: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=501136 |
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| Провери в Paniza Library, AUBG | Сигнатура: |
QC611.8.C64 C48 1995 |
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