ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
| Автор-организация: | International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society., ebrary, Inc. |
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| Формат: | Електронен |
| Език: | English |
| Публикувано: |
Materials Park, OH :
ASM International,
c2005.
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| Предмети: | |
| Онлайн достъп: |
An electronic book accessible through the World Wide Web; click to view |
| Физически характеристики: |
xviii, 524 p. : ill. |
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| Библиография: |
Includes bibliographical references and index. |