Defects and diffusion in semiconductors an annual retrospective. XII /
This twelfth volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective XI (Volume 282). As well as the 565 semiconductor-related abstracts, the issue includes - in line with the policy of including ori...
| Други автори: | Fisher, D. J. |
|---|---|
| Формат: | Електронен |
| Език: | English |
| Публикувано: |
Stafa-Zuerich :
Trans Tech Publications, Ltd.,
℗♭2010.
|
| Серия: |
Diffusion and defect data. Defect and diffusion forum ;
v. 303-304. |
| Предмети: | |
| Онлайн достъп: |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=503493 |
| Подобни документи: |
Print version::
Defects and Diffusion in Semiconductors XII. |
| Резюме: |
This twelfth volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective XI (Volume 282). As well as the 565 semiconductor-related abstracts, the issue includes - in line with the policy of including original papers on all of the major material groups: ""Study of Conduction Mechanism in Amorphous Se85-xTe15Bix Thin Films"" (A. Sharma and P.B. Barman), ""Structure and Optical Properties of Magnetron-Sputtered SiOx Layers with Silicon Nanoparticles"" (L. Khomenkova, N. Korsunska, T. Stara, Y. Goldstein, J. |
|---|---|
| Описание на библ. документ: |
Title from PDF title page (viewed Jan. 7, 2013). |
| Физически характеристики: |
1 online resource : illustrations. |
| Библиография: |
Includes bibliographical references. |
| ISBN: |
9783038133827 3038133825 |
| ISSN: |
0377-6883 ; |